Clamp & Sample ASIC: radiation and cooling (->140K)

Radiation test

• Test plan, exposure at DAPNIA from July 9th to 19th. Total ionisation dose tid= 180kRad
  
• Repair damaged bonding (Systrel, nov 2004)
• Test results: global(gain, offset, noise),  single transistors, reported in Claire's report §8

Cooling test

• Rachid's cold asic simulation (gain, phase, offset, noise)
  
• Extensive tests (noise spectra, etc ) was done during Commissioning IR cryostat
• "Bricolage" (photo, pcb): thermal screen<>asic_cold_pcb<>IR_SC_fp_pcb<>short flex<>feed_thru<>cold_anbx_pcb<>DSA.
• Test results: read Claire's report §7